تهیه لایه نازک سولفید روی دوپ شده با نقره به روش کندوپاش مغناطیسی فرکانس رادیویی

نوع مقاله : مقاله پژوهشی

/amnc.2012.1.3.5

چکیده

در این تحقیق، لایه­های نازکی از سولفید روی دوپ شده با نقره (ZnS:Ag) با استفاده از روش کندوپاش مغناطیسی فرکانس رادیویی (RF) بر روی زیرلایه­های شیشه لایه نشانی شدند. برای حصول لایه نازک بهینه، فشارهای کاری مختلف در محدود torr 3-10×5/1 تا torr 1-10×1 مورد بررسی قرار گرفتند. لایه­های نازک بدست آمده با استفاده از پراش پرتوی ایکس (XRD)، میکروسکوپ نیروی اتمی (AFM)، میکروسکوپ الکترونی روبشی (SEM)، طیف سنجی جذب اتمی (AAS) و آنالیز میکروپروب اشعه ایکس (XPMA) مورد شناسایی قرار گرفتند. نتایج نشان داد که فشار کاری torr 2-10×5 بهترین پوشش را از نظر ترکیب شیمیایی و مورفولوژی حاصل می­کند.

کلیدواژه‌ها


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